Key Applications
- Scanning Electron Microscopy (SEM & FIB)
- Transmission Electron Microscopy (TEM)
- Scanning Tunnel Microscopy (STM)
- Interferometry & Wafer Inspection Systems
- Stationary Roughness Measuring Systems
- Nanoengineering & Nanolithography

AVI200-S/2/LP
AVI200-S/2/LP supporting a Taylor Hobson Form Talysurf Stationary Roughness Measuring Station