Key Applications
- Scanning Electron Microscopy (SEM & FIB)
- Transmission Electron Microscopy (TEM)
- Scanning Tunnel Microscopy (STM)
- Interferometry & Wafer Inspection Systems
- Stationary Roughness Measuring Systems
- Nanoengineering & Nanolithography

AVI400-S/4/LP
AVI400-S/4/LP with LFS-3 sensor supporting a ThermoFisher Talos TEM

AVI400-EM/2/LP
AVI400EM/2/LP supporting a Zeiss Sigma 300 VP