Key Applications
- Scanning Electron Microscopy (SEM & FIB)
- Transmission Electron Microscopy (TEM)
- Scanning Tunnel Microscopy (STM)
- Interferometry & Wafer Inspection Systems
- Stationary Roughness Measuring Systems
- Nanoengineering & Nanolithography
![AVI400S/4/LP](/images/products/avi400/appl/AVI400_TF_Talos.png)
AVI400-S/4/LP
AVI400-S/4/LP with LFS-3 sensor supporting a ThermoFisher Talos TEM
![AVI400EM/2/LP](/images/products/avi400/appl/AVI400EM_ZeissSigma.png)
AVI400-EM/2/LP
AVI400EM/2/LP supporting a Zeiss Sigma 300 VP