Key Applications
- Laser Scanning Microscopy
- Scanning Probe Microscopy (AFM,STM)
- Scanning Near-Field Optical Microscopy (SNOM)
- Interferometry & Profilometry
- Micro & Nano Hardness Tester
- Nano Indentation & Nano Lithography

TS-150/LP
TS-150/LP supporting a WITec alpha300RA AFM (image © WITec)

TS-150/LP
© WITec

TS-150/LP
TS-150/LP supporting a Trioptics µPhase ST Interferometer

TS-140/LP
TS-140/LP supporting a Promicron Workstation for Metrology and Inspection