Key Applications Laser Scanning Microscopy Scanning Probe Microscopy (AFM,STM) Scanning Near-Field Optical Microscopy (SNOM) Interferometry & Profilometry Micro & Nano Hardness Tester Nano Indentation & Nano Lithography TS-150/LP TS-150/LP supporting a WITec alpha300RA AFM (image © WITec) TS-150/LP © WITec TS-150/LP TS-150/LP supporting a Trioptics µPhase ST Interferometer TS-140/LP TS-140/LP supporting a Promicron Workstation for Metrology and Inspection